Edge conduction in monolayer WTe2
Experiments showing that a single layer of WTe 2 can conduct electricity along its edges while insulating in the interior suggests that this material is a two-dimensional topological insulator. A two-dimensional topological insulator (2DTI) is guaranteed to have a helical one-dimensional edge mode 1...
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Published in | Nature physics Vol. 13; no. 7; pp. 677 - 682 |
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Main Authors | , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
London
Nature Publishing Group UK
01.07.2017
Nature Publishing Group Nature Publishing Group (NPG) |
Subjects | |
Online Access | Get full text |
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Summary: | Experiments showing that a single layer of WTe
2
can conduct electricity along its edges while insulating in the interior suggests that this material is a two-dimensional topological insulator.
A two-dimensional topological insulator (2DTI) is guaranteed to have a helical one-dimensional edge mode
1
,
2
,
3
,
4
,
5
,
6
,
7
,
8
,
9
,
10
,
11
in which spin is locked to momentum, producing the quantum spin Hall effect and prohibiting elastic backscattering at zero magnetic field. No monolayer material has yet been shown to be a 2DTI, but recently the Weyl semimetal WTe
2
was predicted
12
to become a 2DTI in monolayer form if a bulk gap opens. Here, we report that, at temperatures below about 100 K, monolayer WTe
2
does become insulating in its interior, while the edges still conduct. The edge conduction is strongly suppressed by an in-plane magnetic field and is independent of gate voltage, save for mesoscopic fluctuations that grow on cooling due to a zero-bias anomaly, which reduces the linear-response conductance. Bilayer WTe
2
also becomes insulating at low temperatures but does not show edge conduction. Many of these observations are consistent with monolayer WTe
2
being a 2DTI. However, the low-temperature edge conductance, for contacts spacings down to 150 nm, never reaches values higher than ∼20 μS, about half the predicted value of
e
2
/
h
, suggesting significant elastic scattering in the edge. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 SC0002197; SC0012509 USDOE Office of Science (SC) |
ISSN: | 1745-2473 1745-2481 |
DOI: | 10.1038/nphys4091 |