Developing linear error models for analog devices

Techniques are presented for developing linear error models for analog and mixed-signal devices. A simulation program developed to understand the modeling process is described, and results of simulations are presented. Methods for optimizing the size of empirical error models based on simulated erro...

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Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 43; no. 2; pp. 157 - 163
Main Authors Stenbakken, G.N., Souders, T.M.
Format Journal Article
LanguageEnglish
Published IEEE 01.04.1994
Subjects
Analytical models
Costs
Error analysis
NIST
Optimization methods
Parameter estimation
Predictive models
Production
Testing
Vectors
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ISSN0018-9456
DOI10.1109/19.293413

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Summary:Techniques are presented for developing linear error models for analog and mixed-signal devices. A simulation program developed to understand the modeling process is described, and results of simulations are presented. Methods for optimizing the size of empirical error models based on simulated error analyses are included. Once established, the models can be used in a comprehensive approach for optimizing the testing of the subject devices. Models are developed using data from a group of 13-bit A/D converters and compared with the simulation results.< >
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ISSN:0018-9456
DOI:10.1109/19.293413