Design of Two-Dimention Interferometer for Measuring Electron Beam Transverse Sizes

• Published in: Advanced materials research Vol. 403-408; pp. 2732 - 2735
• Main Authors: Gu, Li Ming, Tang, Lei Lei, Wang, Ji Gang, Xiao, Yun Yun, Lu, Ping, Sun, Bao Gen
• Format: Journal Article
• Language: English
• Published: Trans Tech Publications Ltd 01.01.2012
• Subjects: Measurement; Simulation; Electron Beam Transverse Sizes; SR Light; Two-Dimention Interferometer
• ISSN: 1022-6680; 1662-8985; 1662-8985
• DOI: 10.4028/www.scientific.net/AMR.403-408.2732

On electron synchrotron, beam profile and transverse sizes are usually measured by SR (synchrotron radiation) light that is radiated by electron beam at bending magnets of synchrotron. In the upgrade project of HLS (Hefei Light Source), the designed horizontal and vertical beam transverse sizes are 0.127mm and 0.06mm respectively, the SR interferometer must be developed at HLS to measure these smaller electron sizes. To avoid the chromatic aberration of the lens, we designed the reflective SR interferometer based on off axis parabolic mirror instead of objective lens. And we used the quad-aperture instead of the double-aperture to design two-dimention SR interferometer. In this paper, design of the optical configuration of two-dimention SR interferometer and basic theory for the measurement of small beam sizes by two-dimention SR interferometer will be presented firstly, and then the two-dimention interferogram will be simulated. Lastly, processing algorithm of interference image will be introduced, and some factors effect on result will be analyzed.