Comparison of Measurements of Charge Transfer Inefficiencies in a CCD With High-Speed Column Parallel Readout

• Published in: IEEE transactions on nuclear science Vol. 57; no. 2; pp. 854 - 859
• Main Authors: Sopczak, Andre, Aoulmit, Salim, Bekhouche, Khaled, Bowdery, Chris, Buttar, Craig, Damerell, Chris, Djendaoui, Dahmane, Dehimi, Lakhdar, Rui Gao, Greenshaw, Tim, Koziel, Michal, Maneuski, Dzmitry, Nomerotski, Andrei, Sengouga, Nouredine, Stefanov, Konstantin, Tikkanen, Tuomo, Woolliscroft, Tim, Worm, Steve, Zhige Zhang
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.04.2010; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Capacitance; CCD; Charge coupled devices; Charge measurement; Charge transfer; charge transfer inefficiency; Charge-coupled image sensors; Collaboration; CPCCD; Current measurement; Detectors; Energy (nuclear); Flavours; High speed; LCFI; Operating temperature; radiation damage; Spatial resolution; Standards development; Thin films; Voltage

Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying short-lived particles. The Linear Collider Flavour Identification (LCFI) Co...