Comparison of Measurements of Charge Transfer Inefficiencies in a CCD With High-Speed Column Parallel Readout

• Published in: IEEE transactions on nuclear science Vol. 57; no. 2; pp. 854 - 859
• Main Authors: Sopczak, Andre, Aoulmit, Salim, Bekhouche, Khaled, Bowdery, Chris, Buttar, Craig, Damerell, Chris, Djendaoui, Dahmane, Dehimi, Lakhdar, Rui Gao, Greenshaw, Tim, Koziel, Michal, Maneuski, Dzmitry, Nomerotski, Andrei, Sengouga, Nouredine, Stefanov, Konstantin, Tikkanen, Tuomo, Woolliscroft, Tim, Worm, Steve, Zhige Zhang
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.04.2010; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Capacitance; CCD; Charge coupled devices; Charge measurement; Charge transfer; charge transfer inefficiency; Charge-coupled image sensors; Collaboration; CPCCD; Current measurement; Detectors; Energy (nuclear); Flavours; High speed; LCFI; Operating temperature; radiation damage; Spatial resolution; Standards development; Thin films; Voltage
• ISSN: 0018-9499; 1558-1578
• DOI: 10.1109/TNS.2010.2041672

Charge Coupled Devices (CCDs) have been successfully used in several high energy physics experiments over the past two decades. Their high spatial resolution and thin sensitive layers make them an excellent tool for studying short-lived particles. The Linear Collider Flavour Identification (LCFI) Collaboration has been developing Column-Parallel CCDs for the vertex detector of a future Linear Collider which can be read out many times faster than standard CCDs. The most recent studies are of devices designed to reduce both the CCD's intergate capacitance and the clock voltages necessary to drive it. A comparative study of measured Charge Transfer Inefficiency values between our previous and new results for a range of operating temperatures is presented.