Localized electric-field-enhanced low-light detection by a 2D SnS visible-light photodetector
Due to their excellent carrier mobility, high absorption coefficient and narrow bandgap, most 2D IVA metal chalcogenide semiconductors (GIVMCs, metal = Ge, Sn, Pb; chalcogen = S, Se) are regarded as promising candidates for realizing high-performance photodetectors. We synthesized high-quality two-d...
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Published in | Chinese physics B Vol. 30; no. 5; pp. 57803 - 745 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
School of Materials Science and Engineering,Xiangtan University,Xiangtan 411105,Hunan,China
01.05.2021
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Subjects | |
Online Access | Get full text |
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Summary: | Due to their excellent carrier mobility, high absorption coefficient and narrow bandgap, most 2D IVA metal chalcogenide semiconductors (GIVMCs, metal = Ge, Sn, Pb; chalcogen = S, Se) are regarded as promising candidates for realizing high-performance photodetectors. We synthesized high-quality two-dimensional (2D) tin sulfide (SnS) nanosheets using the physical vapor deposition (PVD) method and fabricated a 2D SnS visible-light photodetector. The photodetector exhibits a high photoresponsivity of 161 A⋅W
−1
and possesses an external quantum efficiency of 4.45 × 10
4
%, as well as a detectivity of 1.15 × 10
9
Jones under 450 nm blue light illumination. Moreover, under poor illumination at optical densities down to 2 mW⋅cm
−2
, the responsivity of the device is higher than that at stronger optical densities. We suggest that a photogating effect in the 2D SnS photodetector is mainly responsible for its low-light responsivity. Defects and impurities in 2D SnS can trap carriers and form localized electric fields, which can delay the recombination process of electron-hole pairs, prolong carrier lifetimes, and thus improve the low-light responsivity. This work provides design strategies for detecting low levels of light using photodetectors made of 2D materials. |
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ISSN: | 1674-1056 |
DOI: | 10.1088/1674-1056/abd7db |