Localized electric-field-enhanced low-light detection by a 2D SnS visible-light photodetector

Due to their excellent carrier mobility, high absorption coefficient and narrow bandgap, most 2D IVA metal chalcogenide semiconductors (GIVMCs, metal = Ge, Sn, Pb; chalcogen = S, Se) are regarded as promising candidates for realizing high-performance photodetectors. We synthesized high-quality two-d...

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Published inChinese physics B Vol. 30; no. 5; pp. 57803 - 745
Main Authors Wen, Hao, Xiong, Li, Tan, Congbing, Zhu, Kaimin, Tang, Yong, Wang, Jinbin, Zhong, Xiangli
Format Journal Article
LanguageEnglish
Published School of Materials Science and Engineering,Xiangtan University,Xiangtan 411105,Hunan,China 01.05.2021
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Summary:Due to their excellent carrier mobility, high absorption coefficient and narrow bandgap, most 2D IVA metal chalcogenide semiconductors (GIVMCs, metal = Ge, Sn, Pb; chalcogen = S, Se) are regarded as promising candidates for realizing high-performance photodetectors. We synthesized high-quality two-dimensional (2D) tin sulfide (SnS) nanosheets using the physical vapor deposition (PVD) method and fabricated a 2D SnS visible-light photodetector. The photodetector exhibits a high photoresponsivity of 161 A⋅W −1 and possesses an external quantum efficiency of 4.45 × 10 4 %, as well as a detectivity of 1.15 × 10 9 Jones under 450 nm blue light illumination. Moreover, under poor illumination at optical densities down to 2 mW⋅cm −2 , the responsivity of the device is higher than that at stronger optical densities. We suggest that a photogating effect in the 2D SnS photodetector is mainly responsible for its low-light responsivity. Defects and impurities in 2D SnS can trap carriers and form localized electric fields, which can delay the recombination process of electron-hole pairs, prolong carrier lifetimes, and thus improve the low-light responsivity. This work provides design strategies for detecting low levels of light using photodetectors made of 2D materials.
ISSN:1674-1056
DOI:10.1088/1674-1056/abd7db