Assessment of Different Electron Microscopy Techniques for Particle Size Quantification of Potential Nanomaterials

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 21; no. S3; pp. 2403 - 2404
Main Authors Muller, Philipp, Mielke, Johannes, Hodoroaba, Vasile-Dan, Kagi, Ralf, Ryner, Martin
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2015
Oxford University Press
Subjects
A17 Standardization and Metrology in Electron Microscopy and Microbeam Analysis
Analytical and Instrumentation Science Symposia
Automation
Electron microscopes
Nanomaterials
Nanotechnology
Particle size
Scanning electron microscopy
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927615012799