Overview of Commercially Available CEOS Hexapole-type Aberration Correctors

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 20; no. S3; pp. 934 - 935
Main Authors Müller, Heiko, Uhlemann, Stephan, Hartel, Peter, Zach, Joachim, Haider, Max
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2014
Oxford University Press
Subjects
Advances in Instrumentation Symposia
Cs-Correctors: Current State and Ongoing Developments
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927614006394