Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses

Quantitative µ‐XRF analysis based on standardless calibration is limited by the lack of information on the shape of the excitation spectrum resulting from using capillary lenses. The measurement of radiation scattered from a sample was used in combination with Monte Carlo simulation of radiation tra...

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Bibliographic Details
Published inX-ray spectrometry Vol. 34; no. 1; pp. 19 - 27
Main Authors Padilla, R., Van Espen, P., Abrahantes, A., Janssens, K.
Format Journal Article
LanguageEnglish
Published Chichester, UK John Wiley & Sons, Ltd 01.01.2005
Wiley
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Summary:Quantitative µ‐XRF analysis based on standardless calibration is limited by the lack of information on the shape of the excitation spectrum resulting from using capillary lenses. The measurement of radiation scattered from a sample was used in combination with Monte Carlo simulation of radiation transport to estimate the energy spectral distribution of the excitation radiation. Further, a standardless calibration based on the fundamental parameter method implemented in the IAEA‐QXAS software package was carried out and verified for glass and fused ore certified reference materials. The accuracy and repeatability achieved are reported. Copyright © 2004 John Wiley & Sons, Ltd.
Bibliography:istex:AD36E66590118C7629F7AD699D1997E58655F08E
ark:/67375/WNG-TBXJPHWH-M
International Atomic Energy Agency - No. RA-11304.
ArticleID:XRS781
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0049-8246
1097-4539
DOI:10.1002/xrs.781