Modeling Electrostatic Discharge Affecting GMR Heads
Electrostatic discharge (ESD) damage to giant magnetoresistive (GMR) heads is investigated using a charged device model tester. The sensor of a GMR head is easily affected by ESD during handling in production. Simulation of the picking procedure reveals that elevating such a small-capacitance device...
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Published in | IEEE transactions on industry applications Vol. 43; no. 5; pp. 1144 - 1148 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.09.2007
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | Electrostatic discharge (ESD) damage to giant magnetoresistive (GMR) heads is investigated using a charged device model tester. The sensor of a GMR head is easily affected by ESD during handling in production. Simulation of the picking procedure reveals that elevating such a small-capacitance device above the work surface increases the potential by up to ten times and the discharge current by up to five times. With 20-V initial potential, which could be applied by the picking tool, the elevation of a 5-pF capacitance by just 10 mm increases the potential to 200 V and the peak discharge current to 578 mA. In the case of a 1-pF capacitor, however, the potential and peak current remained low due to the effect of stray capacitance. In the case of a GMR head with 3.7-pF capacitance, a 5-mm lift reduced the initial potential causing ESD damage from 60 V to less than 40 V. Waveforms of discharge reveal that the GMR head can be designed to reduce the ESD risk. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 0093-9994 1939-9367 |
DOI: | 10.1109/TIA.2007.904364 |