Low-Voltage Dark-Field STEM Imaging with Optimum Detection Angle

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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Bibliographic Details
Published in	Microscopy and microanalysis Vol. 12; no. S02; pp. 1368 - 1369
Main Authors	Morikawa, A, Kamiya, C, Watanabe, S, Nakagawa, M, Ishitani, T
Format	Journal Article
Language	English
Published	New York, USA Cambridge University Press 01.08.2006 Oxford University Press
Subjects	Advances in STEM Techniques for Materials Characterization
Online Access	Get full text

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Summary:	Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
ISSN:	1431-9276 1435-8115
DOI:	10.1017/S1431927606067821