Tensile and bending piezoelectricity of single-film PVDF monomorphs and bimorphs

• Published in: IEEE transactions on electrical insulation Vol. 24; no. 2; pp. 249 - 254
• Main Authors: Sessler, G.M., Berraissoul, A.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.04.1989; Institute of Electrical and Electronics Engineers
• Subjects: Annealing; Applied sciences; Electrical, magnetic and optical properties; Electron beams; Exact sciences and technology; Physical properties; Piezoelectric films; Piezoelectric polarization; Piezoelectricity; Poles and zeros; Polymer industry, paints, wood; Properties and testing; Resonance; Resonant frequency; Technology of polymers; Tensile strain; Tensile stress; Electrical properties; Film; Vinylidene fluoride polymer; Piezoelectricity; Mechanical properties; Tension test; Bending test
• ISSN: 0018-9367; 1557-962X
• DOI: 10.1109/14.90283

Films of 22 mu m thick polyvinylidenefluoride (PVDF) are poled with partially penetrating monoenergetic electron beams, resulting in monomorph polarizations (zero polarization over part of the sample thickness and large polarization over the remaining part) or bimorph polarizations (polarization changing its sign within the sample) with corresponding distributions of piezoelectricity. Experimental data for the tensile piezoelectric strain constant d/sub 31/ and the bending piezoelectric stress constant beta /sub 31/ with values as high as 13 pC/N and 110 nC/m, respectively, are reported. Both constants decrease with increasing energy of the electron beam. Upon annealing, d/sub 31/ drops initially more rapidly than beta /sub 31/, whereas the opposite is true at later times. The mechanical resonance frequencies and the mechanical deflection under DC bias are discussed.< >