CHARACTERIZATION OF THE SUSCEPTIBILITY OF INTEGRATED CIRCUITS WITH INDUCTION CAUSED BY HIGH POWER MICROWAVES

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Bibliographic Details
Published inElectromagnetic waves (Cambridge, Mass.) Vol. 81; pp. 61 - 72
Main Authors Hwang, Sun-Mook, Hong, Joo-Il, Huh, Chang-Su
Format Journal Article
LanguageEnglish
Published 2008
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ISSN:1559-8985
1559-8985
DOI:10.2528/PIER07121704