Knowledge acquisition and fault diagnosis: experiments with PLAULT

• Published in: IEEE transactions on systems, man, and cybernetics Vol. 20; no. 1; pp. 225 - 242
• Main Author: Sanderson, P.M.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.01.1990; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Circuit faults; Circuit properties; Circuit testing; Cognitive science; Digital circuits; Electric, optical and optoelectronic circuits; Electronic circuits; Electronic equipment testing; Electronics; Exact sciences and technology; Failure analysis; Fault diagnosis; Human factors; Knowledge acquisition; Logic gates; Psychology; Logic circuit; Experimental study; Acquisition; Knowledge; Logic array; Fault diagnostic
• ISSN: 0018-9472; 2168-2909
• DOI: 10.1109/21.47823

A series of experiments using a paradigm called PLAULT, where subjects have to discover the structure of a logical network, is reported. The links in the network are invisible, and subjects have to infer where they are by examining the status of the logic gates under a variety of conditions. Three experiments explore the interaction of features of the task, such as its spatial and graphical complexity, with the cognitive limitations of the learner. A combination of these features predicts which parts of a network subjects can and cannot learn, when knowledge is tested by requiring subjects to draw diagrams of the supposed network structure. These task features also predict efficiency of transfer to a fault diagnosis task. The experiments demonstrate the predictive power that can be gained by identifying task features that are likely to prevent thorough learning of a system. These results are also important for understanding the dissociation of the ability to perform routine tasks and the ability to respond to abnormal events.< >