Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits

• Published in: Electronics (Basel) Vol. 12; no. 24; p. 4978
• Main Authors: Song, Ruiqiang, Shao, Jinjin, Chi, Yaqing, Liang, Bin, Chen, Jianjun, Wu, Zhenyu
• Format: Journal Article
• Language: English
• Published: Basel MDPI AG 01.12.2023
• Subjects: Accuracy; Back propagation networks; Circuit design; Integrated circuits; Machine learning; Neural networks; Probability; Propagation; Pulse propagation; Radiation hardening; Semiconductors; Simulation; Soft errors; Space applications; Spacecraft
• ISSN: 2079-9292; 2079-9292
• DOI: 10.3390/electronics12244978

Transient pulses generated by high-energy particles can cause soft errors in circuits, resulting in spacecraft malfunctions and posing serious threats to the normal operation of spacecraft. For integrated circuits used in space applications, it is necessary to first evaluate soft errors caused by transient pulses. Conventional soft-error-rate evaluation tools are designed to simulate the generation of transient pulses using many accurate models, while the propagation of transient pulses is primarily simulated by circuit-level simulation tools. Due to the limitations of simulation tools, conventional evaluation approaches are limited to the circuit scale. The simulation runtime is unbearable for large-scale integrated circuits. This paper presents an approach for evaluating the soft error rate using machine learning. A back propagation neural network is implemented in the proposed approach. It helps to determine the probability of transient pulse propagation. Compared with the conventional soft-error-rate evaluation results, the proposed approach demonstrates a strong correlation in both trend and magnitude. The average difference between the results obtained using the proposed evaluation method and the experimental results is 23.5%, which is 7.5% higher than that between the results obtained using the conventional evaluation method and the experimental results. Compared to the conventional evaluation method, the proposed approach improves the runtime by an order of magnitude. The proposed approach also benefits the locating of highly sensitive circuit nodes in large-scale integrated circuits. Circuit design and radiation hardening are both useful applications.