Construction of a SXES spectrometer for a conventional SEM

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

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Bibliographic Details
Published inMicroscopy and microanalysis Vol. 19; no. S2; pp. 1278 - 1279
Main Authors Terauchi, M., Koshiya, S., Satoh, F., Takahashi, H., Handa, N., Murano, T., Koike, M., Imazono, T., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa, Z., Kuramoto, S.
Format Journal Article
LanguageEnglish
Published New York, USA Cambridge University Press 01.08.2013
Oxford University Press
Subjects
A16.P1 X-ray Microanalysis in Modern Electron Optical Instruments: Is It Really Quantitative in Today's Diverse Architectures?
Instrumentation Sciences
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Summary:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927613008386