Fundamental aspects of SXES in the Quantification of Minerals and Materials
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Published in | Microscopy and microanalysis Vol. 27; no. S1; pp. 1368 - 1369 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
New York, USA
Cambridge University Press
01.08.2021
Oxford University Press |
Subjects | |
Online Access | Get full text |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
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ISSN: | 1431-9276 1435-8115 |
DOI: | 10.1017/S1431927621005092 |