Comparative characterization of structural alignment within turbostratic CVD graphene by means of Raman scattering and allometric scaling

• Published in: Indian journal of physics Vol. 98; no. 6; pp. 2153 - 2161
• Main Authors: Ghaderi, Atefeh, Azizi, Behnam, Bramowicz, Miroslaw, Kulesza, Slawomir, Gharebagh, Javad Shoa, Jamilpanah, Loghman, Ţălu, Ştefan, Mohseni, Seyed Majid
• Format: Journal Article
• Language: English
• Published: New Delhi Springer India 01.05.2024; Springer Nature B.V
• Subjects: Astrophysics and Astroparticles; Chemical vapor deposition; Fractal analysis; Graphene; Microscopy; Physics; Physics and Astronomy; Raman spectra; Raman spectroscopy; Short Research Communication; Structural analysis; Atomic force microscopy; Raman spectroscopy; Graphene; Chemical vapor deposition; Fractal analysis

The aim of this study was to investigate the geometrical patterns seen on the surface of chemical vapor deposited (CVD) graphene using fractal analysis of surface topography images obtained from atomic force microscopy (AFM) and scanning electron microscopy (SEM) and refer them to the structural dat...