Comparative characterization of structural alignment within turbostratic CVD graphene by means of Raman scattering and allometric scaling

The aim of this study was to investigate the geometrical patterns seen on the surface of chemical vapor deposited (CVD) graphene using fractal analysis of surface topography images obtained from atomic force microscopy (AFM) and scanning electron microscopy (SEM) and refer them to the structural dat...

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Published inIndian journal of physics Vol. 98; no. 6; pp. 2153 - 2161
Main Authors Ghaderi, Atefeh, Azizi, Behnam, Bramowicz, Miroslaw, Kulesza, Slawomir, Gharebagh, Javad Shoa, Jamilpanah, Loghman, Ţălu, Ştefan, Mohseni, Seyed Majid
Format Journal Article
LanguageEnglish
Published New Delhi Springer India 01.05.2024
Springer Nature B.V
Subjects
Astrophysics and Astroparticles
Chemical vapor deposition
Fractal analysis
Graphene
Microscopy
Physics
Physics and Astronomy
Raman spectra
Raman spectroscopy
Short Research Communication
Structural analysis
Atomic force microscopy
Raman spectroscopy
Graphene
Chemical vapor deposition
Fractal analysis
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Summary:The aim of this study was to investigate the geometrical patterns seen on the surface of chemical vapor deposited (CVD) graphene using fractal analysis of surface topography images obtained from atomic force microscopy (AFM) and scanning electron microscopy (SEM) and refer them to the structural data derived using Raman spectroscopy. From this comparison, an insight into structural properties of prepared samples was possible, and performed analysis helped to obtain a comprehensive understanding of a role of physicochemical processes to the shaping of three-dimensional (3D) microtextured surfaces.
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ISSN:0973-1458
0974-9845
DOI:10.1007/s12648-023-02986-4