ITO/Cu-mesh transparent conductive film with high weather resistance and electromagnetic interference shielding effectiveness
Cu-mesh transparent conductive film offers high conductivity and transparency, making it suitable for electromagnetic interference (EMI) shielding. However, the oxidation of the Cu-mesh transparent conductive film in the atmosphere, limits its use. To solve this problem, the ITO/Cu-mesh transparent...
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Published in | Bulletin of materials science Vol. 47; no. 2; p. 76 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Bangalore
Indian Academy of Sciences
08.04.2024
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | Cu-mesh transparent conductive film offers high conductivity and transparency, making it suitable for electromagnetic interference (EMI) shielding. However, the oxidation of the Cu-mesh transparent conductive film in the atmosphere, limits its use. To solve this problem, the ITO/Cu-mesh transparent conductive film structure is employed to avoid Cu oxidation and improve EMI shielding performance in this study. By stacking the Cu mesh with ITO film, the resistivity and average X-band EMI shielding effectiveness can be improved from 7.89 × 10
−7
Ω cm and − 23.4 dB to 7.35 × 10
−7
Ω cm and − 25.6 dB, respectively. Additionally, we performed a 72-h salt corrosion test on the samples in accordance with the ASTM B-117 guidelines; the ITO/Cu-mesh film structure does not observe any obvious etching or oxidation. The results show that ITO films are suitable as a protective Cu-mesh coating and confirming that ITO/Cu-meshes have excellent weather resistance and EMI shielding effectiveness. |
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ISSN: | 0973-7669 0250-4707 0973-7669 |
DOI: | 10.1007/s12034-024-03145-z |