Automatic golden device selection and measurement smoothing algorithms for microwave transistor small-signal noise modeling

• Published in: International journal of microwave and wireless technologies Vol. 15; no. 3; pp. 465 - 476
• Main Authors: Salnikov, Andrei S., Dobush, Igor M., Popov, Artem A., Bilevich, Dmitry V., Goryainov, Aleksandr E., Kalentyev, Alexey A., Metel, Aleksandr A.
• Format: Journal Article
• Language: English
• Published: Cambridge, UK Cambridge University Press 01.04.2023
• Subjects: Algorithms; Amplifier design; Automation; Circuits; Data smoothing; Datasets; Design; Microwave Measurements; Mixers; Modelling; Noise measurement; Power amplifiers; Switches; Transistors; golden device; microwave measurements; Automation; microwave transistor; semiconductor devices and IC-technologies; pHEMT; small-signal noise model; GaAs; measurement smoothing; de-embedding
• ISSN: 1759-0787; 1759-0795
• DOI: 10.1017/S175907872200068X

We propose the techniques for automatic processing of measurement results in the context of golden (typical) device selection and noise figure measurement. These techniques are for golden (typical) device selection and noise figure measurement processing. Automation of measurement result processing and microwave element modeling speeds up a modeling routine and decreases the risk of possible errors. The techniques are validated through modeling of 0.15 μm GaAs pHEMTs with 4 × 40 μm and 4 × 75 μm total gate widths. Two test amplifiers were designed using the developed models. The amplifier modeling results agree well with measurements which confirms the validity of the proposed techniques. The proposed algorithm is potentially applicable to other circuit types (switches, digital, power amplifiers, mixers, oscillators, etc.) but may require different settings in those cases. However, in the presented work, we validated the algorithm for the linear and low-noise amplifiers only.