X-ray diffraction characterization of magnetostriction in Terfenol-D

• Published in: Powder diffraction Vol. 40; no. 1; pp. 1 - 6
• Main Authors: Rodriguez, Mark A., Faltas, Mina, Valdez, Nichole R., Lowry, Daniel R.
• Format: Journal Article
• Language: English
• Published: New York, USA Cambridge University Press 01.03.2025
• Subjects: Technical Article; X-ray diffraction; XRD; Magnetostriction; Terfenol-D; Tb0.3Dy0.7Fe2
• ISSN: 0885-7156; 1945-7413
• DOI: 10.1017/S0885715624000617

The magnetostrictive response of a Terfenol-D pellet was measured via a laboratory-based X-ray diffractometer. X-ray diffraction patterns were collected from the pellet sample with and without the presence of an applied magnetic field (~30 mT) generated by placing a large magnet under the pellet. A standard reference material, Silicon 640c, was employed as an internal standard. Magnetostriction values of 323 and 227 ppm Δl/l were determined for the (104) and (110) indexed peaks, respectively, assuming a rhombohedral structure for Terfenol-D. A threshold noise level value of ~20 to 30 ppm Δl/l was suggested based on before/after measurements in the absence of the applied field. No clear evidence of domain wall rotation was detected via changes in relative intensities of diffraction peaks in the presence of the applied magnetic field.