Radiation Hardness of a Silicon MESFET 4K x 1 sRAM

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Bibliographic Details
Published inIEEE transactions on nuclear science Vol. 31; no. 6; pp. 1483 - 1486
Main Authors Houston, T. W., Hite, L. R., Darley, H. M., Shedd, W. M., Zugich, M. H., Lapierre, D. C.
Format Journal Article
LanguageEnglish
Published 01.01.1984
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ISSN:0018-9499
DOI:10.1109/TNS.1984.4333534