Diffraction of X-rays in Crystals: A Tensor Approach

The use of X-ray synchrotron radiation makes it possible to observe the polarization, spectral, and angular dependences for diffraction reflections. Their theoretical study calls for application of a tensor approach to describe the interaction of X-rays with atoms of matter. Various representations...

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Bibliographic Details
Published inCrystallography reports Vol. 68; no. 3; pp. 351 - 362
Main Authors Oreshko, A. P., Ovchinnikova, E. N., Dmitrienko, V. E.
Format Journal Article
LanguageEnglish
Published Moscow Pleiades Publishing 01.06.2023
Springer Nature B.V
Subjects
Anisotropy
Crystallography and Scattering Methods
Magnetic properties
Mathematical analysis
Multipoles
Physics
Physics and Astronomy
Reviews
Scattering amplitude
Synchrotron radiation
Synchrotrons
Tensors
X-ray scattering
X-rays
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Summary:The use of X-ray synchrotron radiation makes it possible to observe the polarization, spectral, and angular dependences for diffraction reflections. Their theoretical study calls for application of a tensor approach to describe the interaction of X-rays with atoms of matter. Various representations of the tensor atomic scattering amplitude, results of experimental observations of the anisotropy of resonant X-ray scattering, and the relationship of the electric and magnetic multipole moments on atoms with the properties of forbidden resonant reflections are considered.
ISSN:1063-7745
1562-689X
DOI:10.1134/S1063774523700013