Stress Relaxation in CrSi2 Crystals Grown under Microgravity Conditions from Zn Melt in the Cr–Si–Zn System

Experimental data obtained in a study of CrSi 2 microcrystals grown under microgravity conditions from a Zn melt in the Cr–Si–Zn system by the mass crystallization method and then placed in terrestrial conditions are presented and analyzed. New properties of crystals of this kind are observed.

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Bibliographic Details
Published inTechnical physics letters Vol. 45; no. 7; pp. 687 - 689
Main Authors Kalashnikov, E. V., Gurin, V. N., Nikanorov, S. P., Yagovkina, M. A., Derkachenko, L. I.
Format Journal Article
LanguageEnglish
Published Moscow Pleiades Publishing 01.07.2019
Springer Nature B.V
Subjects
Chromium
Classical and Continuum Physics
Crystal growth
Crystallization
Microcrystals
Microgravity
Physics
Physics and Astronomy
Silicon
Stress relaxation
Weightlessness
microgravity
relaxation
defects
crystallization
crystal structure
excess stress
lattice constants
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Summary:Experimental data obtained in a study of CrSi 2 microcrystals grown under microgravity conditions from a Zn melt in the Cr–Si–Zn system by the mass crystallization method and then placed in terrestrial conditions are presented and analyzed. New properties of crystals of this kind are observed.
ISSN:1063-7850
1090-6533
DOI:10.1134/S106378501907006X