A high‐integration dual‐resonance element with independent frequency tuning for wideband reflectarrays

In this letter, a novel design methodology of dual‐resonance elements for wideband reflectarrays is proposed for the first time. The alluring merits of this design lie in the compact common‐via dual‐resonance element with weak inner coupling and independent frequency tuning. To improve compactness,...

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Bibliographic Details
Published inElectronics letters Vol. 60; no. 2
Main Authors Liu, Meicheng, Hou, Yuefeng
Format Journal Article
LanguageEnglish
Published 01.01.2024
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Summary:In this letter, a novel design methodology of dual‐resonance elements for wideband reflectarrays is proposed for the first time. The alluring merits of this design lie in the compact common‐via dual‐resonance element with weak inner coupling and independent frequency tuning. To improve compactness, a traditional dipole is terminated by a metallic via connected to the ground plane. The element operates in monopole mode, decreasing the size by half. To realize a high‐integration dual‐resonance element, two monopoles operating at different frequencies are adopted to construct an asymmetric common‐via element, with an equivalent size to the traditional dipole resonating at merely one frequency. The first‐ever proposed element embodies superiorities of compactness, independent frequency tuning, and low profile. The proof‐of‐concept is validated by a fabricated reflectarray. The elaborately designed element with a compact size of 0.42 λ × 0.105 λ × 0.0737 λ exhibits an extended phase range of 484° at 14 GHz. The measured 3‐dB gain bandwidth is 36% (12.5–18 GHz) with a maximum gain of 26.9 dBi. The design strategy is capable of integrating more resonant structures in a compact area, rendering it suitable for broadband reflectarrays. A novel design methodology of dual‐resonance elements for wideband reflectarrays is presented in this letter. The first‐ever proposed common‐via dual‐resonance element with independent frequency tuning exhibits advantages of compactness and large reflected phase range.
ISSN:0013-5194
1350-911X
DOI:10.1049/ell2.13095