Electrodeless Measurement of Semiconductor Resistivity at Microwave Frequencies

A new microwave technique for the measurement of conductivity of semiconductors has been explored and provides agreement with more conventional methods. The proposed technique depends upon the absorption of the microwave power being propagated through a semiconductor medium. This eliminates the need...

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Bibliographic Details
Published inProceedings of the IRE Vol. 49; no. 5; pp. 928 - 932
Main Authors Jacobs, H., Brand, F. A., Meindl, J. D., Benanti, M., Benjamin, R.
Format Journal Article
LanguageEnglish
Published IEEE 01.05.1961
Subjects
Conductivity
Electromagnetic wave absorption
Electromagnetic waveguides
Frequency measurement
Germanium
Jacobian matrices
Microwave frequencies
Microwave measurements
Microwave theory and techniques
Semiconductor waveguides
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Summary:A new microwave technique for the measurement of conductivity of semiconductors has been explored and provides agreement with more conventional methods. The proposed technique depends upon the absorption of the microwave power being propagated through a semiconductor medium. This eliminates the need for electrode attachment, making the experimental aspects of the measurement more simple. In addition, since the microwave method depends more on bulk properties, it may be less subject to error due to surface leakage or crystal imperfections in the semiconductor.
ISSN:0096-8390
DOI:10.1109/JRPROC.1961.287936