Rotational magnetizations of particulate and thin film recording media

• Published in: IEEE transactions on magnetics Vol. 34; no. 2; pp. 393 - 395
• Main Author: HSU, S.-W
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.03.1998; Institute of Electrical and Electronics Engineers
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Disk recording; Exact sciences and technology; Magnetic anisotropy; Magnetic field measurement; Magnetic materials; Magnetic properties and materials; Magnetic properties of monolayers and thin films; Magnetic properties of surface, thin films and multilayers; Magnetic separation; Magnetostatics; Microstructure; Perpendicular magnetic anisotropy; Perpendicular magnetic recording; Physics; Transistors; Thin films; Magnetization curve; Magnetization; Magnetic field effects; Recording material; Experimental study; Rotation angle; Magnetic properties
• ISSN: 0018-9464; 1941-0069
• DOI: 10.1109/20.667773

Magnetizations (M/sub x/, along the direction of applied field) as functions of rotational angle (/spl theta/) for particulate and thin film recording media in various applied fields (H) were studied. M/sub k/(/spl theta/) was analyzed through the Fourier components (C/sub n/) and the corresponding phases (/spl theta//sub n/). The /spl theta//sub n/(H) curves for the increasing- and decreasing-field processes of the particulate recording medium are observed to be separated for H lower than specific values. However, this feature is not evident for the thin film recording medium. The distinction is related with the different microstructures of these two types of recording medium.