Precoated AISI441 for SOFC Interconnectors Studied by TEM Methods

Precoated AISI441 (EN 1.4509) for SOFC interconnectors were investigated using energy-filtered transmission electron microscopy (EFTEM) and electron energy-loss spectroscopy (EELS) looking at the diffusion processes in the initial stage of the oxidation. The PVD coating contained Ce and Co/Mn-alloy...

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Bibliographic Details
Published inECS transactions Vol. 57; no. 1; pp. 2321 - 2329
Main Authors Lundberg, Mats W, Karlsson, Lisa S, Berger, Robert, Folkeson, Nicklas, Westlinder, Jörgen, Holmberg, Håkan
Format Journal Article
LanguageEnglish
Published The Electrochemical Society, Inc 01.01.2013
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Summary:Precoated AISI441 (EN 1.4509) for SOFC interconnectors were investigated using energy-filtered transmission electron microscopy (EFTEM) and electron energy-loss spectroscopy (EELS) looking at the diffusion processes in the initial stage of the oxidation. The PVD coating contained Ce and Co/Mn-alloy in two layers with at total thickness of 800nm. The samples were exposed up to 168 hours at 800°C then characterized by TEM. In parallel cyclic oxidation and chromium volatilization studies have been performed. The studies have revealed that the Ce retard the outward migration of Cr though the scale and that the discrete Ce layer transforms to isolated nanoparticles during initial oxidation.
ISSN:1938-5862
1938-6737
DOI:10.1149/05701.2321ecst