A high sensitivity process variation sensor utilizing sub-threshold operation
In this paper, we propose a novel low-power, bias-free, high-sensitivity process variation sensor for monitoring random variations in the threshold voltage. The proposed sensor design utilizes the exponential current-voltage relationship of sub-threshold operation thereby improving the sensitivity b...
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Published in | 2008 IEEE Custom Integrated Circuits Conference pp. 125 - 128 |
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Main Authors | , , , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
01.09.2008
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Subjects | |
Online Access | Get full text |
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Summary: | In this paper, we propose a novel low-power, bias-free, high-sensitivity process variation sensor for monitoring random variations in the threshold voltage. The proposed sensor design utilizes the exponential current-voltage relationship of sub-threshold operation thereby improving the sensitivity by 2.3X compared to the above-threshold operation. A test-chip containing 128 PMOS and 128 NMOS devices has been fabricated in 65 nm bulk CMOS process technology. A total of 28 dies across the wafer have been fully characterized to determine the random threshold voltage variations. |
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ISBN: | 9781424420186 1424420180 |
ISSN: | 0886-5930 2152-3630 |
DOI: | 10.1109/CICC.2008.4672037 |