Characterization of silicon carbide surfaces of 6H-, 15R- and 3C-polytypes by optical second-harmonic generation in comparison with X-ray diffraction techniques
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Published in | Applied physics. A, Materials science & processing Vol. 65; no. 3; pp. 251 - 257 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Berlin
Springer
01.09.1997
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Subjects | |
Online Access | Get full text |
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ISSN: | 0947-8396 1432-0630 |
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DOI: | 10.1007/s003390050574 |