Optimization of Dual-workfunction Line Tunnel Field-effect Transistor with Island Source Junction

In this research, a novel dual workfunction (DWF) line tunnel field-effect transistor (LTFET) is optimized by using high WF gate-drain underlap and low WF gate-source underlap. Through numerical technology computer-aided design (TCAD) device simulations, it is confirmed that on-current (ION) can be...

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Published inJournal of semiconductor technology and science Vol. 23; no. 4; pp. 207 - 214
Main Authors Yun, Chaewon, Kim, Sangwan, Cho, Seongjae, Cho, Il-Hwan, Kim, Hyunwoo, Kim, Jang-Hyun, Kim, Garam
Format Journal Article
LanguageEnglish
Published 대한전자공학회 01.08.2023
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Abstract In this research, a novel dual workfunction (DWF) line tunnel field-effect transistor (LTFET) is optimized by using high WF gate-drain underlap and low WF gate-source underlap. Through numerical technology computer-aided design (TCAD) device simulations, it is confirmed that on-current (ION) can be increased by highly localized point tunneling while suppressing off-current (IOFF) by adjusting the distance between low-WF gate and source junction. Considering on-off current ratio (ION/IOFF) and the process variation, the distance between high-WF gate and source junction is optimized to be 3 to 5 nm. KCI Citation Count: 0
AbstractList In this research, a novel dual workfunction (DWF) line tunnel field-effect transistor (LTFET) is optimized by using high WF gate-drain underlap and low WF gate-source underlap. Through numerical technology computer-aided design (TCAD) device simulations, it is confirmed that on-current (ION) can be increased by highly localized point tunneling while suppressing off-current (IOFF) by adjusting the distance between low-WF gate and source junction. Considering on-off current ratio (ION/IOFF) and the process variation, the distance between high-WF gate and source junction is optimized to be 3 to 5 nm. KCI Citation Count: 0
Author Hyunwoo Kim
Jang Hyun Kim
Seongjae Cho
Garam Kim
Chaewon Yun
Il Hwan Cho
Sangwan Kim
Author_xml – sequence: 1
  givenname: Chaewon
  surname: Yun
  fullname: Yun, Chaewon
– sequence: 2
  givenname: Sangwan
  surname: Kim
  fullname: Kim, Sangwan
– sequence: 3
  givenname: Seongjae
  surname: Cho
  fullname: Cho, Seongjae
– sequence: 4
  givenname: Il-Hwan
  surname: Cho
  fullname: Cho, Il-Hwan
– sequence: 5
  givenname: Hyunwoo
  surname: Kim
  fullname: Kim, Hyunwoo
– sequence: 6
  givenname: Jang-Hyun
  surname: Kim
  fullname: Kim, Jang-Hyun
– sequence: 7
  givenname: Garam
  surname: Kim
  fullname: Kim, Garam
BackLink https://www.kci.go.kr/kciportal/ci/sereArticleSearch/ciSereArtiView.kci?sereArticleSearchBean.artiId=ART002987421$$DAccess content in National Research Foundation of Korea (NRF)
BookMark eNo9UNtKAzEUDKJgvfyAT3nxRdiae7aP4rVSLNj1OWSzJxq7JpLdpejXu9UiDMxwzsw5MEdoP6YICJ1RMpVS88vHVbWaMsL4dIQYld5DE8Y4L0Sp1D6aUDkrC6qkPkRHXfdOiCr1TE-QXX724SN82z6kiJPHN4Nti03Kaz9E9ztchAi4GmKEFt8FaJsCvAfX4yrb2IWuTxlvQv-G511rY4NXacgO8OMuf4IOvG07ON3xMXq5u62uH4rF8n5-fbUoHFO8L5xnta0FkUAa70tBQWrBXS299V6BVTUHqD31NWfQjAstREOpbUrlSgKWH6OLv7sxe7N2wSQbfvk1mXU2V8_V3FDCZkoQPZrZn9nl1HUZvPnM4cPmr9Fito2abaNm26gZIUa1DZ3vPgyjGZpg_1NPy5tbSiWRdKb5DyY9eqc
ContentType Journal Article
DBID DBRKI
TDB
AAYXX
CITATION
ACYCR
DOI 10.5573/JSTS.2023.23.4.207
DatabaseName DBPIA - 디비피아
누리미디어 DBpia
CrossRef
Korean Citation Index
DatabaseTitle CrossRef
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 2233-4866
1598-1657
EndPage 214
ExternalDocumentID oai_kci_go_kr_ARTI_10296407
10_5573_JSTS_2023_23_4_207
NODE11505197
GroupedDBID 9ZL
ADDVE
AENEX
ALMA_UNASSIGNED_HOLDINGS
C1A
DBRKI
FRP
GW5
HH5
JDI
KVFHK
MZR
OK1
TDB
TR2
ZZE
AAYXX
CITATION
.UV
ACYCR
ID FETCH-LOGICAL-c263t-cf2bab405e0dff841e5743cb5faff6ea6b3eebf1fb32ed3cb744d11ad86c80ea3
ISSN 1598-1657
2233-4866
IngestDate Fri May 31 03:51:23 EDT 2024
Tue Jul 01 02:28:34 EDT 2025
Thu Mar 13 19:38:00 EDT 2025
IsPeerReviewed false
IsScholarly true
Issue 4
Keywords junction underlap
TCAD device simulation
line tunneling fieldeffect transistor (LTFET)
Dual workfunction
low-power operation
Language English
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c263t-cf2bab405e0dff841e5743cb5faff6ea6b3eebf1fb32ed3cb744d11ad86c80ea3
PageCount 8
ParticipantIDs nrf_kci_oai_kci_go_kr_ARTI_10296407
crossref_primary_10_5573_JSTS_2023_23_4_207
nurimedia_primary_NODE11505197
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2023-08-01
PublicationDateYYYYMMDD 2023-08-01
PublicationDate_xml – month: 08
  year: 2023
  text: 2023-08-01
  day: 01
PublicationDecade 2020
PublicationTitle Journal of semiconductor technology and science
PublicationYear 2023
Publisher 대한전자공학회
Publisher_xml – name: 대한전자공학회
SSID ssj0068797
Score 2.26326
Snippet In this research, a novel dual workfunction (DWF) line tunnel field-effect transistor (LTFET) is optimized by using high WF gate-drain underlap and low WF...
SourceID nrf
crossref
nurimedia
SourceType Open Website
Index Database
Publisher
StartPage 207
SubjectTerms 전기공학
Title Optimization of Dual-workfunction Line Tunnel Field-effect Transistor with Island Source Junction
URI https://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE11505197
https://www.kci.go.kr/kciportal/ci/sereArticleSearch/ciSereArtiView.kci?sereArticleSearchBean.artiId=ART002987421
Volume 23
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
ispartofPNX JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE, 2023, 23(4), 112, pp.207-214
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1bT9swFLYKe9j2MO2qwTZkaXur3OXiOOkj4qKCNnigSLxFdmJ3G5BMpRESP4jfyTm2k2ZlSGNS5EZu4qY-X87N5xwT8gUs47hISs6EgteNh4qzsRiDIidBe1dZGZZ2l4jvR2Jyyg_PkrPB4LYXtdQs1Ki4-Wteyf9QFfqArpgl-wjKdoNCB5wDfaEFCkP7TzQ-hvf90idSota328gLhpFWKK1s5zdUIqcNBrMM9zFYjbkADlfU3JYIca5YhIYN4kRf_vDQ3_-A6nqFEfV1haViMUix887blQgvUzt20rTL-vq6v-R_6fzR1ex6ic-dH9Zxe6LravZL6pXugws2aS_2fooo7qLkPDsDPSRmPBO-8LVnt2OwYYUrUd3yY5d_7HHH-8zV7Y_r5XTkkk9XRUCSpFiKAtjayQgfYwQH-s7SpcBrF_lX5GAXnQh2EY6S4xg5jpHDweEsXSNPIjBHIisAOjNLZKndxKf7hy45C8f4ev85_lCA1qo5tE-rBvdyAIbQ022mL8kLT1m67RD2igx09Zo875WqfENkH2u0NvQe1ihijTqs0T7W6BJrFLFGHdaowxptsfaWnO7vTXcmzG_PwYpIxAtWmEhJBQq_DkpjMh7qBNTRQiVGGiO0FCrWWpnQqDjSJXyRcl6GoSwzUWSBlvE7sl7VlX5PaBGEJuCFzILMcO22wgNNWaB6DgJYbpBhO2f5b1eFJX-YShvkM0xrfl78zLF4On7O6vx8noOJeAD3YaQBXrXVTXs36NHx7h7aSJjOvfmoH_1Ani1R_5GsL-aN_gT66kJtWbDcAVrXlU4
linkProvider ABC ChemistRy
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Optimization+of+Dual-workfunction+Line+Tunnel+Field-effect+Transistor+with+Island+Source+Junction&rft.jtitle=Journal+of+semiconductor+technology+and+science&rft.au=Yun%2C+Chaewon&rft.au=Kim%2C+Sangwan&rft.au=Cho%2C+Seongjae&rft.au=Cho%2C+Il-Hwan&rft.date=2023-08-01&rft.issn=2233-4866&rft.eissn=1598-1657&rft.volume=23&rft.issue=4&rft.spage=207&rft.epage=214&rft_id=info:doi/10.5573%2FJSTS.2023.23.4.207&rft.externalDBID=n%2Fa&rft.externalDocID=10_5573_JSTS_2023_23_4_207
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1598-1657&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1598-1657&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1598-1657&client=summon