Influence of the Carrier Phase on Flicker Measurement for Rectangular Voltage Fluctuations

This paper presents an analysis of the influence of the phase relationship between the fundamental frequency and the rectangular voltage fluctuation on flicker measurements made by the International Electrotechnical Commission (IEC) flickermeter. We analytically studied the origin of the deviations...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 61; no. 3; pp. 629 - 635
Main Authors Ruiz, J., Lazkano, A., Gutierrez, J. J., Leturiondo, L. A., Azkarate, I., Saiz, P., Redondo, K.
Format Journal Article
LanguageEnglish
Published IEEE 01.03.2012
Subjects
Flicker
Frequency measurement
Frequency modulation
IEC
IEC standards
International Electrotechnical Commission (IEC) flickermeter
Phase measurement
power quality
rectangular voltage fluctuation
Voltage fluctuations
Voltage measurement
{\bf P}_{\bf st}
Online AccessGet full text

Cover

More Information
Summary:This paper presents an analysis of the influence of the phase relationship between the fundamental frequency and the rectangular voltage fluctuation on flicker measurements made by the International Electrotechnical Commission (IEC) flickermeter. We analytically studied the origin of the deviations for a set of significant fluctuation frequencies. We found that the nonlinear behavior of the squaring multiplier of the IEC flickermeter produces an additional dc component in instantaneous flicker sensation P inst for several rectangular fluctuation frequencies. The value of this dc component depends on the phase relationship between the fundamental and the fluctuation frequency. The analysis of this paper has contributed to clarify the definition of some performance tests of the IEC flickermeter standard IEC 61000-4-15 ed.2. This will help develop calibration and verification methods for the flickermeters.
ISSN:0018-9456
1557-9662
DOI:10.1109/TIM.2011.2171611