Pulsed laser deposition and in-field characterization of FeTe0.8S0.2 epitaxial thin films with enhanced superconducting properties

• Published in: Physica. C, Superconductivity Vol. 470; no. 20; pp. 1033 - 1037
• Main Authors: Mele, P., Matsumoto, K., Haruyama, Y., Mukaida, M., Yoshida, Y., Ichino, Y., Kiss, T., Ichinose, A.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.11.2010; Elsevier
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Exact sciences and technology; Fe-based superconductors; FeTeS; Low tc films; Physics; Superconducting films and low-dimensional structures; Superconductivity; Thin films; Upper critical field; Thin films; Upper critical field; FeTeS; Fe-based superconductors; Tc; Superconducting thin films; Electrical conductivity; Epitaxial layers; Superconducting transitions; Epitaxy; Pulsed laser deposition; XRD; Critical field; Substrates; Coherence length; Superconductors; T; Iron Sulfides tellurides
• ISSN: 0921-4534; 1873-2143
• DOI: 10.1016/j.physc.2010.05.028

Fe–Te–S thin films deposited by pulsed laser deposition at 400°C on SrTiO3 (100) and MgO (100) single crystals showed epitaxy and 4-fold symmetry. Films deposited on both substrates reached zero resistance condition (Tc0=3.54K on STO and 5.37K on MgO) and presented large upper critical field (Bc2(0) = 61.1T on STO and 74.2T for MgO using 90% of the normal state resistance and Werthamer–Helfand–Hohenberg model), indicating that the coherence length ξ0 of the present films is very short (ξ0=2.3nm on STO and 2.1nm on MgO).