Stochastic Fatigue Life and Reliability Prediction Based on Residual Strength

A randomized approach is developed to solve a deterministic equation. The method uses random deterministic approach to achieve the fatigue life based on residual strength and S-N curve. We propose a one-to-one transformation method to deduce the distribution of fatigue life from the residual strengt...

Full description

Saved in:
Bibliographic Details
Published inShanghai jiao tong da xue xue bao Vol. 20; no. 3; pp. 331 - 337
Main Author 左芳君 朱顺鹏 高会英 吕志强 黄洪钟
Format Journal Article
LanguageEnglish
Published Shanghai Shanghai Jiaotong University Press 01.06.2015
Subjects
Architecture
Computer Science
Electrical Engineering
Engineering
Fatigue life
Life Sciences
Materials Science
Mathematical analysis
Residual strength
S N diagrams
Stochasticity
Transformations
Universities
residual strength
strength degradation
TH 140.1
fatigue damage
Online AccessGet full text

Cover

More Information
Summary:A randomized approach is developed to solve a deterministic equation. The method uses random deterministic approach to achieve the fatigue life based on residual strength and S-N curve. We propose a one-to-one transformation method to deduce the distribution of fatigue life from the residual strength. The proposed method is simple and effective, and can be used for fatigue life prediction. An example is given to illustrate how the method works.
Bibliography:A randomized approach is developed to solve a deterministic equation. The method uses random deterministic approach to achieve the fatigue life based on residual strength and S-N curve. We propose a one-to-one transformation method to deduce the distribution of fatigue life from the residual strength. The proposed method is simple and effective, and can be used for fatigue life prediction. An example is given to illustrate how the method works.
31-1943/U
fatigue damage, residual strength, strength degradation
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1007-1172
1995-8188
DOI:10.1007/s12204-015-1632-9