Column readout circuit with global charge amplifier for CMOS APS imagers

A correlated double sampling (CDS) readout circuit for complimentary metal oxide semiconductor (CMOS) active pixel sensor (APS) imagers is presented. The proposed CDS circuit has only one output amplifier common to all columns of the imager. Simulations were performed using the ELDO circuit simulato...

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Bibliographic Details
Published inElectronics letters Vol. 36; no. 17; pp. 1457 - 1459
Main Authors Değerli, Y., Lavernhe, F., Magnan, P., Farré, P.J.
Format Journal Article
LanguageEnglish
Published 17.08.2000
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Summary:A correlated double sampling (CDS) readout circuit for complimentary metal oxide semiconductor (CMOS) active pixel sensor (APS) imagers is presented. The proposed CDS circuit has only one output amplifier common to all columns of the imager. Simulations were performed using the ELDO circuit simulator with CMOS 0.7 mu m process BSIM3v3 transistor models. A non-inverting configuration of the circuit may be obtained by interchanging the SHR and SHS sampling signals.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0013-5194
DOI:10.1049/el:20001071