Column readout circuit with global charge amplifier for CMOS APS imagers
A correlated double sampling (CDS) readout circuit for complimentary metal oxide semiconductor (CMOS) active pixel sensor (APS) imagers is presented. The proposed CDS circuit has only one output amplifier common to all columns of the imager. Simulations were performed using the ELDO circuit simulato...
Saved in:
Published in | Electronics letters Vol. 36; no. 17; pp. 1457 - 1459 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
17.08.2000
|
Online Access | Get full text |
Cover
Loading…
Summary: | A correlated double sampling (CDS) readout circuit for complimentary metal oxide semiconductor (CMOS) active pixel sensor (APS) imagers is presented. The proposed CDS circuit has only one output amplifier common to all columns of the imager. Simulations were performed using the ELDO circuit simulator with CMOS 0.7 mu m process BSIM3v3 transistor models. A non-inverting configuration of the circuit may be obtained by interchanging the SHR and SHS sampling signals. |
---|---|
Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0013-5194 |
DOI: | 10.1049/el:20001071 |