Rapid evaluation method for the normal lifetime of an infrared light-emitting diode

Abstract： Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature an...

Full description

Saved in:
Bibliographic Details
Published inJournal of semiconductors Vol. 34; no. 11; pp. 61 - 64
Main Author 郭小峰、 谭满清 韦欣 焦健 郭文涛 孙宁宁
Format Journal Article
LanguageEnglish
Published 01.11.2013
Subjects
Accelerated life tests
Activation energy
Construction
Electric current
Infrared
Light-emitting diodes
Mathematical models
Semiconductors
加速寿命试验
寿命计算
快速评价方法
模型构建
活化能
电流应力
红外二极管
红外发光二极管
Online AccessGet full text

Cover

More Information
Summary:Abstract： Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature and electric current stress. Using this method, the activation energy and the IRLED＇s normal lifetime are calculated and analyzed. Key words： Arrhenius model; acceleration lifetime test; IRLED; activation energy
Bibliography:Guo Xiaofeng, Tan Manqing, Wei Xin, Jiao Jian, Guo Wentao, Sun Ningning（ Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China）
11-5781/TN
Abstract： Based on the Arrhenius model, a rapid evaluation method for an infrared diode＇s normal lifetime is proposed, and the theoretical model is constructed. Accelerated life testing of an infrared light-emitting diode （IRLED）, which takes less time than usual, is carried out under temperature and electric current stress. Using this method, the activation energy and the IRLED＇s normal lifetime are calculated and analyzed. Key words： Arrhenius model; acceleration lifetime test; IRLED; activation energy
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-4926
DOI:10.1088/1674-4926/34/11/114009