Time-Resolved Spatial Profile Measurements of the Ion Temperature on JET

A new diagnostic instrumental method based on the scattering of the neutral particles of a high-energetic probing beam is proposed for the continuous measurements of the ion temperature and density profiles of the JET plasma. A compact multichannel energy analyzer using the time-of-flight (TOF) meth...

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Bibliographic Details
Published inIEEE transactions on plasma science Vol. 9; no. 3; pp. 92 - 96
Main Authors Brocken, H. J. B. M., Van Der Ven, H. W.
Format Journal Article
LanguageEnglish
Published IEEE 01.01.1981
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Summary:A new diagnostic instrumental method based on the scattering of the neutral particles of a high-energetic probing beam is proposed for the continuous measurements of the ion temperature and density profiles of the JET plasma. A compact multichannel energy analyzer using the time-of-flight (TOF) method is introduced as an appropriate analyzing technique.
ISSN:0093-3813
1939-9375
DOI:10.1109/TPS.1981.4317402