Structural and optical properties of Cd0.8Zn0.2S thin films

• Published in: Journal of semiconductors Vol. 32; no. 2; pp. 11 - 14
• Main Author: 狄霞 田彩娟 唐容喆 李卫 冯良桓 张静全 武莉莉 雷智
• Format: Journal Article
• Language: English
• Published: IOP Publishing 01.02.2011
• Subjects: XPS测量; X射线光电子能谱; X射线荧光光谱; X射线衍射仪; 光学特性; 六方结构; 石英晶体振荡器; 薄膜沉积
• ISSN: 1674-4926
• DOI: 10.1088/1674-4926/32/2/022003

Cdl-xZnxS thin films were deposited on glass substrates by a vacuum coevaporation method. The structural, compositional, and optical properties of as-deposited Cdo.sZno.2S films were investigated using X-ray diffraction （XRD）, X-ray fluorescence （XRF）, X-ray photoelectron spectroscopy （XPS）, and optical transmittance spectrum. The thin films are hexagonal in structure, with strong preferential orientation along the （002） planes. The composition of Cdl-xZnx S thin films monitored by a quartz crystal oscillator agrees well with that obtained from XRF and XPS measurements. The optical constants, such as refractive index, single-oscillator energy, dispersion energy, absorption coefficients, and the optical band gap, were deduced by the Swanepoel＇s method, in combination with the Wemple and DiDomenico single-oscillator model, from the transmission spectrum of Cd0.8Zn0.2S thin films.