Crystallization behaviour and phase coexistence at morphotrophic phase boundaries in PZT thin films prepared by sol-gel processing

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Bibliographic Details
Published inJournal of materials science Vol. 31; no. 14; pp. 3639 - 3642
Main Authors ONTALUS, V, COBIANU, C, VASILIU, F, PARLOG, C
Format Journal Article
LanguageEnglish
Published Heidelberg Springer 15.07.1996
Subjects
Condensed matter: structure, mechanical and thermal properties
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Materials science
Methods of deposition of films and coatings; film growth and epitaxy
Physics
Solid phase epitaxy; growth from solid phases
Structure and morphology; thickness
Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
Inorganic compounds
Phase studies
Phase transformations
Lead titanates
Crystallization
PZT
Experimental study
Lattice parameters
Oxide ceramics
Lead zirconates
Thin films
Chemical preparation
Thermal annealing
Quaternary compounds
Sol-gel process
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ISSN:0022-2461
1573-4803
DOI:10.1007/BF00352771