Recoil spectrometry : ion accelerator based elemental characterisation of surface layers

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Bibliographic Details
Published inMikrochimica acta (1966) Vol. 120; no. 1-4; pp. 171 - 181
Main Authors WHITLOW, H. J, ANDERSSON, M, JOHNSTON, P. N, BUBB, I. F, WALKER, S. R, JOHANSON, E, HOGMARK, S, INGEMARSSON, P. A, HULT, M, PERSSON, L, MOHAMED EL BOUANANI, ÖSTLING, M, ZARING, C, LUNDBERG, N, COHEN, D. D, DYTLEWSKI, N
Format Conference Proceeding Journal Article
LanguageEnglish
Published Wien Springer 01.03.1995
New York, NY
Subjects
Analytical chemistry
Chemistry
Exact sciences and technology
Spectrometric and optical methods
Elementary analysis
Lubricating oil
Rutherford backscattering
Time of flight method
Depth profile
Surface analysis
Quantum yield
Dispersive spectrometry
Mass spectrometry
Interface
Thin film
Tribology
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ISSN:0026-3672
1436-5073
DOI:10.1007/BF01244430