Crystal growth of Bi2TeO5 by a double crucible Czochralski method

Single crystals of bismuth tellurite (Bi2TeO5) were grown by a double crucible Czochralski method at different pulling and rotation rates, ranging from 0.1mm/h to 0.8mm/h and from 5rpm to 20rpm, respectively. The crystallized phase was verified by X-ray diffraction measurements, occurring structural...

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Bibliographic Details
Published inJournal of crystal growth Vol. 401; pp. 795 - 797
Main Authors Carvalho, J.F., Fabris, Z.V., de Oliveira, I., Frejlich, J.
Format Journal Article Conference Proceeding
LanguageEnglish
Published Amsterdam Elsevier B.V 01.09.2014
Elsevier
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Summary:Single crystals of bismuth tellurite (Bi2TeO5) were grown by a double crucible Czochralski method at different pulling and rotation rates, ranging from 0.1mm/h to 0.8mm/h and from 5rpm to 20rpm, respectively. The crystallized phase was verified by X-ray diffraction measurements, occurring structural defects were characterized, and the growth conditions were studied being determined the better parameters to growth good-quality single crystals with uniform pale yellow coloration. Optical band gap of 3.1eV was determined from the optical transmission spectrum. •Single crystals of Bi2TeO5 were grown for the first time by a double crucible technique.•The technique was effective to suppress the drawbacks of TeO2 partial evaporation.•Crystalline samples homogeneous and free of macroscopic defects were obtained.
ISSN:0022-0248
1873-5002
DOI:10.1016/j.jcrysgro.2013.11.098