X-ray diffraction study of Ge-Bi-Te mixed-layer ternary compounds

The structures of the Ge3Bi2Te6, GeBi6Te10, and Ge2Bi10Te17 compounds, belonging to thenGeTe ·mBi2Te3 homologous series, were studied by x-ray diffraction. For Ge3Bi2Te6, the atomic coordinates, lattice parameters, and interatomic distances were determined. This compound was shown to contain mixed (...

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Published inInorganic materials Vol. 36; no. 11; pp. 1108 - 1113
Main Authors Karpinskii, O. G., Shelimova, L. E., Kretova, M. A., Zemskov, V. S.
Format Journal Article
LanguageEnglish
Published New York Springer Nature B.V 01.11.2000
Subjects
Bismuth
Hexagonal cells
Lattice parameters
Single crystals
X-ray diffraction
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Summary:The structures of the Ge3Bi2Te6, GeBi6Te10, and Ge2Bi10Te17 compounds, belonging to thenGeTe ·mBi2Te3 homologous series, were studied by x-ray diffraction. For Ge3Bi2Te6, the atomic coordinates, lattice parameters, and interatomic distances were determined. This compound was shown to contain mixed (Ge + Bi) cation layers. The c parameters of the hexagonal cells of GeBi6Te10 and Ge2Bi10Te17 were determined. It is shown that the x-ray patterns from the cleaved surfaces of single-crystalnGeTe ·mBi2Te3 compounds vary in a systematic manner with increasingn/m ratio, which is attributable to the filling of empty Te octahedra. For 00l reflections, indexl can be expressed in general form throughn andm.
ISSN:0020-1685
1608-3172
DOI:10.1007/BF02758926