Nanofabrication and characterization using a scanning tunneling microscope

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Published inNanotechnology Vol. 4; no. 4; pp. 194 - 199
Main Authors Dagata, J A, Tseng, W, Schneir, J, Silver, R M
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.10.1993
Institute of Physics
Subjects
Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components, and techniques
Characterization
Fabrication
Surfaces
Scanning tunneling microscopy
Semiconductor materials
Passivation
Online AccessGet full text

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Author Dagata, J A
Tseng, W
Schneir, J
Silver, R M
Author_xml – sequence: 1
  fullname: Dagata, J A
– sequence: 2
  fullname: Tseng, W
– sequence: 3
  fullname: Schneir, J
– sequence: 4
  fullname: Silver, R M
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=3945445$$DView record in Pascal Francis
BookMark eNqNUD1PwzAQtVCRaAs_gC0DAwOhdvyReEQV5UMVLDBbF8cGo9SJ7HSAX0-soC5d0Bvu6e69O71boJnvvEHokuBbgqtqhSUvc8YqtkrAmJ6gOaGC5IIX1QzND_MztIjxC2NCqoLM0fML-M5CHZyGwXU-A99k-hMC6MEE9zM199H5jwyyqMH7RIe996ZNbOd06KLuenOOTi200Vz81SV639y_rR_z7evD0_pum-uCl0POal1SDQWhuKhrgcsCy9KWjWRADdWWNpxYaSWWVhCoBJe1lFpYLISW3NZ0ici0Nx2OwVjVB7eD8K0IVukZKoVVKaxKGJ8xeq4mTw9jhtYG8NrFg5FKxhnjo-xmkrmu_9fW62P5kUz1jaW_dCJ7dw
CitedBy_id crossref_primary_10_1021_a1960008
crossref_primary_10_1016_0965_9773_95_00113_1
Cites_doi 10.1116/1.585467
10.1016/0304-3991(92)90437-O
10.1117/12.136012
10.1116/1.578443
10.1116/1.577990
10.1557/PROC-236-217
10.1116/1.585978
10.1063/1.102999
10.1063/1.105708
10.1063/1.350345
10.1116/1.578342
10.1116/1.585202
10.1063/1.108865
10.1063/1.103869
ContentType Journal Article
Copyright 1994 INIST-CNRS
Copyright_xml – notice: 1994 INIST-CNRS
DBID IQODW
AAYXX
CITATION
DOI 10.1088/0957-4484/4/4/003
DatabaseName Pascal-Francis
CrossRef
DatabaseTitle CrossRef
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1361-6528
EndPage 199
ExternalDocumentID 10_1088_0957_4484_4_4_003
3945445
GroupedDBID -
02O
123
1JI
1PV
1WK
29M
53G
5VS
5ZI
7.M
9BW
AAGCD
AAGCF
AAJIO
AALHV
AAPBV
ABHWH
ABPTK
ACGFS
AEFHF
AENEX
AFFNX
AFYNE
AHGVY
AHSEE
ALMA_UNASSIGNED_HOLDINGS
ASPBG
ATQHT
AVWKF
AZFZN
BBWZM
CJUJL
CS3
DU5
EBS
EDWGO
EJD
EQZZN
F5P
FEDTE
HAK
HVGLF
IHE
IOP
IZVLO
KC5
KNG
KOT
LAP
M45
MGA
N5L
N9A
NT-
NT.
P2P
Q02
R4D
RIN
RNS
RO9
ROL
RPA
RW3
S3P
T37
TN5
UNR
X
XPP
ZMT
---
-~X
4.4
5B3
5PX
5ZH
6XO
7.Q
8WZ
A6W
AAJKP
AATNI
ABQJV
ABVAM
ACAFW
ACHIP
AKPSB
CBCFC
CEBXE
CRLBU
EMSAF
EPQRW
IJHAN
IQODW
JCGBZ
PJBAE
SY9
W28
AAYXX
ABJNI
ACMRT
AERVB
AOAED
CITATION
ID FETCH-LOGICAL-c257t-4bc73ca21302bb6072097f7d94a3e3cf3d51f9f909f61a8659b99c6f066c95fb3
IEDL.DBID IOP
ISSN 0957-4484
IngestDate Thu Sep 26 17:44:53 EDT 2024
Tue Sep 20 22:59:33 EDT 2022
Tue Nov 10 14:51:10 EST 2020
Mon May 13 15:55:10 EDT 2019
IsPeerReviewed true
IsScholarly true
Issue 4
Keywords Characterization
Fabrication
Surfaces
Scanning tunneling microscopy
Semiconductor materials
Passivation
Language English
License CC BY 4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c257t-4bc73ca21302bb6072097f7d94a3e3cf3d51f9f909f61a8659b99c6f066c95fb3
PageCount 6
ParticipantIDs pascalfrancis_primary_3945445
iop_primary_10_1088_0957_4484_4_4_003
crossref_primary_10_1088_0957_4484_4_4_003
PublicationCentury 1900
PublicationDate 19931001
PublicationDateYYYYMMDD 1993-10-01
PublicationDate_xml – month: 10
  year: 1993
  text: 19931001
  day: 01
PublicationDecade 1990
PublicationPlace Bristol
PublicationPlace_xml – name: Bristol
PublicationTitle Nanotechnology
PublicationYear 1993
Publisher IOP Publishing
Institute of Physics
Publisher_xml – name: IOP Publishing
– name: Institute of Physics
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Marrian C R K (7) 1992; 1671
17
Dagata J A (3) 1992; 11
Kajimura K (18) 1992
Taniguchi N (1) 1992
Dagata J A (13) 1991; 13
Tseng W (19) 1994
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Whitehouse D J (2) 1992
Glembocki O J (8) 1992; 236
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– ident: 5
  doi: 10.1063/1.108865
– ident: 15
  doi: 10.1063/1.103869
SSID ssj0011821
Score 1.4978276
SourceID crossref
pascalfrancis
iop
SourceType Aggregation Database
Index Database
Enrichment Source
Publisher
StartPage 194
SubjectTerms Electron, positron and ion microscopes, electron diffractometers and related techniques
Exact sciences and technology
Instruments, apparatus, components and techniques common to several branches of physics and astronomy
Physics
Scanning probe microscopes, components, and techniques
Title Nanofabrication and characterization using a scanning tunneling microscope
URI http://iopscience.iop.org/0957-4484/4/4/003
Volume 4
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3dS8MwEA86EPTBj6k4dRJBX4TOtU0_8ijiGAM_HhzsreSjERG7sXUv_vXeJV3dGMjIS6DXNL2myV3ud78QcqPzAPepAk8H4K4yWBI8cIOYZyJjhFA8zC2l0PNL3B-ywSga_fFsf44n1czfgaqN5IMNkHjgRLB7LI7ZE9N_MVnv9a2OGICd7DtePSe9iGCCg7fWwsoatA0PQkSkmIFSjDvNYmmJ6R243O2ZZSZEZMlXZ17KjvpZ523cpPeHZL8yNemDGxtHZCsvmmRviYCwSXYsAFTNjskAptmxEXJa7eFRUWiqajZnl6xJESX_QQWFl7BHHdFyjjgZrH0jss_muJyQYe_p_bHvVecseAp-2NJjUiWhEgHGMKWMu0nQ5YlJNGcizENlQh35hhve5Sb2RRpHXHKuYgPWiuKRkeEpaRTjIj8jNPSlYEpaChyW6hzZ6xVHyvog1r6MWuRuofls4ug0MhsGT9MMVZWhqjIsoKoWuQY11nJr17OJNi1yuyzzT1vtlS9c3xFyhnxE5xu2c0F2LeTRwvkuSaOczvM2mCWlvLLj8RdxUdat
link.rule.ids 315,783,787,1560,27936,27937,53918
linkProvider IOP Publishing
linkToPdf http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV3PS8MwFH7oRNGDv8Wp0wp6EbqtTfojR1HHNnV6cOCtJGkjIm5j6y7-9b4k3dhURJBcAk3S5EubvOR9-QJwlma-3qfy3dTH5SrFKcHFZRB1VaAU55KRzEgK3XfCZpe2n4PnmVP8r_1BMfRXMWqFgi2EBSEurqFRELm4qqA1HfRG3CBVi7AUEOZpUlfr4XHqR0Dr2bNqezbLxK_5UzFzM9Mivl3zJPkIoVL2jouZiaexAXxSZcs3eauOc1GVH1_UHP_Tpk1YL6xS59Km34KFrLcNazNahduwbLiicrQDbRyR-4qLYbHd5_Be6sip8LM91-loQv2Lwx1smbkVycnHmlKjY--aBGiOw-xCt3HzdNV0iysZXIn_du5SISMiua_dnUKE9civs0hFKaOcZEQqkgaeYorVmQo9HocBE4zJUKFhI1mgBNmDUq_fy_bBIZ7gVAqjlkPjNNNC95JpdXs_TD0RlOFi0h3JwCpvJMZjHseJhivRcCU6IFxlOEVop-m-PU8QzjKcz6b5pazKXLdPcxBGtXTRwR_LOYGVx-tGctfq3B7CqiFKGhLgEZTy4TiroDGTi2PzvX4CJEnmoA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Nanofabrication+and+characterization+using+a+scanning+tunneling+microscope&rft.jtitle=Nanotechnology&rft.au=Dagata%2C+J+A&rft.au=Tseng%2C+W&rft.au=Schneir%2C+J&rft.au=Silver%2C+R+M&rft.date=1993-10-01&rft.issn=0957-4484&rft.eissn=1361-6528&rft.volume=4&rft.issue=4&rft.spage=194&rft.epage=199&rft_id=info:doi/10.1088%2F0957-4484%2F4%2F4%2F003&rft.externalDBID=n%2Fa&rft.externalDocID=10_1088_0957_4484_4_4_003
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0957-4484&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0957-4484&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0957-4484&client=summon