APA (7th ed.) Citation

Chwastek, E. J., & Shaw, R. N. (1987). A rapid technique for assessing the moisture ingress susceptibility of plastic-encapsulated integrated circuits. Quality and reliability engineering international, 3(3), 185-193. https://doi.org/10.1002/qre.4680030309

Chicago Style (17th ed.) Citation

Chwastek, E. J., and R. N. Shaw. "A Rapid Technique for Assessing the Moisture Ingress Susceptibility of Plastic-encapsulated Integrated Circuits." Quality and Reliability Engineering International 3, no. 3 (1987): 185-193. https://doi.org/10.1002/qre.4680030309.

MLA (9th ed.) Citation

Chwastek, E. J., and R. N. Shaw. "A Rapid Technique for Assessing the Moisture Ingress Susceptibility of Plastic-encapsulated Integrated Circuits." Quality and Reliability Engineering International, vol. 3, no. 3, 1987, pp. 185-193, https://doi.org/10.1002/qre.4680030309.