Synergistic effect of total ionizing dose on single event effect induced by pulsed laser microbeam on SiGe heterojunction bipolar transistor

Saved in:
Bibliographic Details
Published inChinese physics B Vol. 27; no. 10; p. 108501
Main Authors Zhang, Jin-Xin, Guo, Hong-Xia, Pan, Xiao-Yu, Guo, Qi, Zhang, Feng-Qi, Feng, Juan, Wang, Xin, Wei, Yin, Wu, Xian-Xiang
Format Journal Article
LanguageEnglish
Published 01.10.2018
Online AccessGet full text

Cover

More Information
ISSN:1674-1056
DOI:10.1088/1674-1056/27/10/108501