A general approach for degradation modeling to enable a widespread use of aging simulations in IC design
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Published in | Microelectronics and reliability Vol. 137; p. 114775 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
01.10.2022
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Online Access | Get full text |
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ISSN: | 0026-2714 |
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DOI: | 10.1016/j.microrel.2022.114775 |