Flexible time reduction method for burn‐in of high‐quality products

Burn‐in is an effective method to screen out early failures of electronic devices. Typically, this is achieved by operating the devices under accelerated stress conditions. This paper focuses on a burn‐in concept where a random sample of devices is drawn out of the running production, put to burn‐in...

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Bibliographic Details
Published inQuality and reliability engineering international Vol. 37; no. 6; pp. 2900 - 2915
Main Authors Kurz, Daniel, Lewitschnig, Horst, Pilz, Juergen
Format Journal Article
LanguageEnglish
Published Bognor Regis Wiley Subscription Services, Inc 01.10.2021
Subjects
binomial distribution
burn‐in
consumer's risk
Distribution functions
Electronic devices
Failure analysis
lifetime distribution
Sampling
sampling plan
zero defects
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Summary:Burn‐in is an effective method to screen out early failures of electronic devices. Typically, this is achieved by operating the devices under accelerated stress conditions. This paper focuses on a burn‐in concept where a random sample of devices is drawn out of the running production, put to burn‐in, and investigated for early failures. This procedure is called burn‐in study. In parallel, as long as the burn‐in study is ongoing, all other produced devices are subjected to burn‐in screening. In this article, new flexible sampling plans for burn‐in studies are introduced. These are based on the progress of these studies and defined quality targets. Furthermore, these sampling plans enable fast burn‐in time reductions and various time reduction strategies. From a statistical point of view, this requires to combine the proportion of early failures in a population with their lifetime distribution function. The new model is illustrated by case studies and simulations. It contributes to burn‐in cost reductions, while controlling quality levels at the same time.
ISSN:0748-8017
1099-1638
DOI:10.1002/qre.2896