Influence of Triangle Structure Defect on the Carrier Lifetime of the 4H-SiC Ultra-Thick Epilayer

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Published inChinese physics letters Vol. 35; no. 7; p. 77103
Main Authors Niu, Ying-Xi, Tang, Xiao-Yan, Jia, Ren-Xu, Sang, Ling, Hu, Ji-Chao, Yang, Fei, Wu, Jun-Min, Pan, Yan, Zhang, Yu-Ming
Format Journal Article
LanguageEnglish
Published 01.07.2018
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Author Jia, Ren-Xu
Niu, Ying-Xi
Zhang, Yu-Ming
Sang, Ling
Wu, Jun-Min
Tang, Xiao-Yan
Yang, Fei
Pan, Yan
Hu, Ji-Chao
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CitedBy_id crossref_primary_10_1088_1361_6641_acd4df
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Cites_doi 10.1063/1.4837996
10.1016/S0927-796X(97)00005-3
10.1063/1.4991815
10.1016/S0925-9635(97)00083-6
10.1063/1.3681806
10.1002/9781118313534
10.1063/1.4871076
10.1063/1.2170144
10.4028/www.scientific.net/MSF.389-393.199
10.1063/1.2740580
10.1109/TED.2014.2352279
10.1063/1.3517487
10.1016/j.spmi.2016.03.029
10.1143/APEX.5.101301
10.4028/www.scientific.net/MSF.457-460.565
10.1063/1.2472530
10.7567/APEX.9.061303
10.1016/j.jcrysgro.2007.05.042
10.1002/pssb.200844076
10.1021/cg5007154
10.1007/s11664-006-0059-3
10.4028/www.scientific.net/MSF.897.587
10.1143/JJAP.46.L973
10.7567/JJAP.54.040103
10.4028/www.scientific.net/MSF.778-780.382
10.4028/www.scientific.net/MSF.600-603.481
10.1103/PhysRevLett.109.187603
10.4028/www.scientific.net/MSF.556-557.247
10.4028/www.scientific.net/MSF.821-823.847
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References 22
23
24
25
26
27
28
Hoshino N (30) 2007; 46
Feng G (29) 2009; 94
Cheng P (13) 2010; 19
31
10
32
11
33
12
14
16
17
18
19
Kimoto T (3) 2015; 54
Zhang J (6) 2003; 934
1
Ichikawa S (15) 2012; 5
Dong L (2) 2013; 30
4
5
7
8
9
Saito E (20) 2016; 9
21
References_xml – ident: 17
  doi: 10.1063/1.4837996
– ident: 1
  doi: 10.1016/S0927-796X(97)00005-3
– ident: 9
  doi: 10.1063/1.4991815
– ident: 26
  doi: 10.1016/S0925-9635(97)00083-6
– ident: 16
  doi: 10.1063/1.3681806
– ident: 18
  doi: 10.1002/9781118313534
– ident: 8
  doi: 10.1063/1.4871076
– ident: 11
  doi: 10.1063/1.2170144
– ident: 28
  doi: 10.4028/www.scientific.net/MSF.389-393.199
– volume: 19
  issn: 1674-1056
  year: 2010
  ident: 13
  publication-title: Chin. Phys.
  contributor:
    fullname: Cheng P
– ident: 22
  doi: 10.1063/1.2740580
– ident: 5
  doi: 10.1109/TED.2014.2352279
– ident: 14
  doi: 10.1063/1.3517487
– ident: 10
  doi: 10.1016/j.spmi.2016.03.029
– volume: 94
  year: 2009
  ident: 29
  publication-title: Appl. Phys. Express
  contributor:
    fullname: Feng G
– volume: 5
  issn: 1882-0786
  year: 2012
  ident: 15
  publication-title: Appl. Phys. Express
  doi: 10.1143/APEX.5.101301
  contributor:
    fullname: Ichikawa S
– ident: 7
  doi: 10.4028/www.scientific.net/MSF.457-460.565
– ident: 19
  doi: 10.1063/1.2472530
– volume: 9
  issn: 1882-0786
  year: 2016
  ident: 20
  publication-title: Appl. Phys. Express
  doi: 10.7567/APEX.9.061303
  contributor:
    fullname: Saito E
– ident: 25
  doi: 10.1016/j.jcrysgro.2007.05.042
– ident: 23
  doi: 10.1002/pssb.200844076
– ident: 27
  doi: 10.1021/cg5007154
– ident: 32
  doi: 10.1007/s11664-006-0059-3
– volume: 30
  issn: 0256-307X
  year: 2013
  ident: 2
  publication-title: Chin. Phys. Lett.
  contributor:
    fullname: Dong L
– ident: 21
  doi: 10.4028/www.scientific.net/MSF.897.587
– volume: 46
  start-page: L973
  issn: 1347-4065
  year: 2007
  ident: 30
  publication-title: Jpn. J. Appl. Phys.
  doi: 10.1143/JJAP.46.L973
  contributor:
    fullname: Hoshino N
– volume: 54
  issn: 1347-4065
  year: 2015
  ident: 3
  publication-title: Jpn. J. Appl. Phys.
  doi: 10.7567/JJAP.54.040103
  contributor:
    fullname: Kimoto T
– ident: 31
  doi: 10.4028/www.scientific.net/MSF.778-780.382
– ident: 24
  doi: 10.4028/www.scientific.net/MSF.600-603.481
– ident: 12
  doi: 10.1103/PhysRevLett.109.187603
– volume: 934
  start-page: 708
  year: 2003
  ident: 6
  publication-title: J. Appl. Phys.
  contributor:
    fullname: Zhang J
– ident: 33
  doi: 10.4028/www.scientific.net/MSF.556-557.247
– ident: 4
  doi: 10.4028/www.scientific.net/MSF.821-823.847
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