Influence of Triangle Structure Defect on the Carrier Lifetime of the 4H-SiC Ultra-Thick Epilayer

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Bibliographic Details
Published inChinese physics letters Vol. 35; no. 7; p. 77103
Main Authors Niu, Ying-Xi, Tang, Xiao-Yan, Jia, Ren-Xu, Sang, Ling, Hu, Ji-Chao, Yang, Fei, Wu, Jun-Min, Pan, Yan, Zhang, Yu-Ming
Format Journal Article
LanguageEnglish
Published 01.07.2018
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ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/35/7/077103